Tessent FastScan

Tessent FastScan is the gold standard in automatic test pattern generation, creating high-coverage, compact test sets with support for a wide range of fault models, comprehensive design rule checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction.

Supports all traditional fault models, timing aware test, user-defined fault models, Cell-Aware test, Automotive-grade ATPG, and false and multi-cycle paths.

Support for any common scan implementation. Fully integrated with Tessent Scan / ScanPro. Designed to work in all design environments using any combination of synthesis, place-and-route, and verification tools.